This application note provides guidelines for the use of Wafer Level Chip Size Packages (WLCSP). The information in this application note can be used throughout the various stages of WLCSP use. This ...
Things are moving really fast at the moment as this year, we see both Fan-out wafer level packaging and chip embedding into PCB laminate infrastructures emerging at the same time, ramping to high ...
FREMONT, CA / ACCESS Newswire / November 12, 2025 / Aehr Test Systems (AEHR), a worldwide supplier of semiconductor test and burn-in solutions, today announced the shipment of its Dual-Echo™ test and ...
A fully qualified, high-performance, low-power and small-form-factor wafer-level chip-scale package (W-CSP) developed by Oki Semiconductor satisfies a wide range of ASIC design demands. Targeting chip ...
Microchip has developed a single-I/O bus UNI/O EEPROM devices in miniature, wafer-level chip-scale and TO-92 packages, in addition to the 3-pin SOT-23 package. Measuring 0.85 mm x 1.38 mm, the ...
A look at design considerations for a double-sided RDL, including board-level reliability and the challenges of higher density. System-in-Package (SiP) technology continues to be essential for higher ...
Semiconductor metrology equipment manufacturer Jordan Valley Semiconductors announced that they have sold, installed and qualified multiple units of their JVX 6200 system to leading memory ...
Extensive Array of Back-End and Advanced Packaging Wet Wafer Process Equipment Leverages ACM’s Experience to Address Emerging Requirements for Wafer-Level Packaging FREMONT, Calif., Oct. 15, 2020 ...
Considered something of a necessary evil, burn-in of IC packages during production does a great job of weeding out latent defects so they don’t turn into failures in the field. But as AI and ...
FREMONT, CA / ACCESS Newswire / February 26, 2026 / Aehr Test Systems (NASDAQ:AEHR), a leading provider of test and burn-in ...
This application note presents the Wafer Level Chip Size Packages (WLCSP) guidelines. The method uses ball drop bumps with bump pitches of 500 µm and 400 µm and plated bumps with bump pitches of 400 ...