Imaging spectroscopic ellipsometry delivers nanometer-level sensitivity and spatial resolution, addressing the limitations of conventional metrology techniques.

In the field of physical optics, a propagating light beam is known as a propagating electromagnetic radiation, with the direction of propagation being horizontal to the direction of the electric and ...

The Ellipsometry is a total optical measurement method. This technique is used to measure the change of polarization of light when passing through a medium. Due to the layer structure during ...

Optical characterisation of thin films is a critical field that bridges fundamental research and application in materials science and engineering. It encompasses the use of various spectroscopic ...

Metrology supplier Nanometrics Inc. today unveiled an integrated metrology tool combining ultraviolet spectroscopic ellipsometry and deep ultraviolet (DUV) spectroscopic reflectometry. In dielectric ...

Researchers typically use Raman spectroscopy to check the structural quality and thickness of graphene, but because the technique can only cover a small area in a given time, it’s painfully slow. It ...