Advances in deep learning have transformed the field of infrastructure maintenance, particularly in the automated detection and characterisation of defects in sewer pipelines. Leveraging large volumes ...
A new technical paper titled “A Universal AI-Powered Segmentation Model for PCBA and Semiconductor” was published by researchers at Nordson Corporation. “This paper introduces a novel universal deep ...
Researchers have designed a robust image-based anomaly detection (AD) framework with illumination enhancement and noise suppression features that can enhance the detection of subtle defects in ...
A new technical paper titled “Towards Improved Semiconductor Defect Inspection for high-NA EUVL based on SEMI-SuperYOLO-NAS” was published by researchers at KU Leuven, imec, Ghent University, and ...
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